Gatan Inc. recently launched a new addition to its range of imaging products for the scanning electron microscope: the XuM. Originally developed by CSIRO and XRT Limited in Australia, the XuM utilizes a SEM as a host instrument to enable x-ray imaging of the internal structure of objects with resolutions down to less than 100nm. X-ray images generated in the XuM take advantage of both absorption and phase contrast to reveal fine structure and edge definition in a wide range of sample materials from semiconductor devices to low density polymer composites and biological specimens. Using the XuM, the ability to perform 2D and full 3D tomography means that complex internal structures can be explored without ever needing to cross-section the sample.
Published in Drug Discovery & Development magazine: Vol. 10, No. 9, September, 2007, p.40.
Filed Under: Drug Discovery